EM All-In-One: A Physics-Driven Diffusion Foundation Model for Electron Microscopy

Overview

EM All-In-One is a cutting-edge diffusion-based foundation model designed to revolutionize electron microscopy (EM) and volumetric EM (vEM) image processing. Our physics-driven approach leverages over 1.7 million EM/vEM images to provide zero-shot solutions for diverse imaging challenges.

Key Features

✔ Multi-task Solution

• Denoising
• 2D Super-resolution reconstruction
• Deblurring
• 3D isotropic volume reconstruction

✔ Technical Advantages

• Zero-shot reconstruction (no paired training needed)
• A unified solution for all tasks
• A foundation model for omni-sample type scanning elecron microscopy (SEM) data

Usage Options

🌐 Online Demo (Recommended)

For most users, we recommend our web platform: 🔗 generativemicroscope.com
✅ No installation required
✅ User-friendly interface

💻 Local Deployment

This repository provides resources for:

1. Local deployment
2. Model training
3. Physical model embedding