yield-analysis

A d3.js wafer map in a react component

Interactive wafer map visualization and yield analysis for semiconductor test data. Rendering, spatial statistics, failure clustering, lot-level trends, and reticle analysis — pure ES modules, no dependencies.

📊 A Power BI project that analyzes agricultural productivity across Indian states using rainfall, fertilizer usage, pesticide application, and yield data. The interactive dashboard allows users to explore crop-wise and state-wise performance, identify key influencers, and derive actionable insights for improving agricultural outcomes.

Desktop and browser wafer map viewer for semiconductor test data — Tauri v2, Rust/WASM parsers for STDF/ATDF/CSV/JSON/Parquet, wafermap rendering

Municipal bond anomaly detector — flags small munis (<$20M) paying 50+ bps above peer average

Cambi Protocol's Cross-Collateral Yield Optimization Engine

Most associations in this public semiconductor dataset are artifacts of time. 32 features clear BH-FDR with permutation p=0.0005, but only 2 survive a change of time period. Chronological split, DuckDB/SQL warehouse, SPC, cost-aware baseline, every transform fitted on train only.

Automated root-cause analysis pipeline for semiconductor yield excursions using Random Forest classification.

JMP-based lithography focus-dose process window and yield analysis using public exposure and inspection data.

Physics-based Monte Carlo yield analysis and design optimisation tool for MZI optical switches in silicon photonics. Validated against published fab data.

Have an LLM control QuantLib, the cache, your databases and any plug-in tools. Comes with an evaluator framework and an Excel/LibreOffice interface in https://github.com/FulgentMcGuffin/cqfi-xl

NAND validation analytics dashboard for yield review, firmware comparison, outlier detection, and release-readiness gating.

Yield Analytics

Which 16 of 24? Recovering per-die CPU core-harvest maps from out-of-band BMC telemetry — 1,962 POWER9 sockets, reproducible from public M100 ExaData

EFA-aware wafer map failure pattern classification on WM-811K — calibrated confidence, selective prediction, honest evaluation

Monte Carlo mismatch analysis and statistical verification for analog ICs, on a from-scratch MNA/Newton-Raphson circuit simulator. Cross-validated against ngspice.

Semiconductor yield analysis platform built on UCI SECOM dataset (1567 lots × 590 sensors, ~924K rows in PostgreSQL)

Semiconductor manufacturing yield analysis using the UCI SECOM dataset, with preprocessing, feature selection, imbalanced classification, and explainability.